Automated Laser Diode Characterisation and Test System

Automated Laser Diode Characterisation and Test System A fully automated test system for characterising and testing laser diodes before and after burn in and reliability tests. They system carries out nearfield, farfield, wavelength, optical power and LIV (Optical Power, current, voltage) measurements. There are 2 systems, one for low power devices, typically under 1A which uses air cooling if required and a high power system which is water cooled and can handle lasers up to 250A. In addition for high power lasers with multiple emission areas the system can measure the smile down to 1μm. The test system is connected to the instrument box by a cable, and can be mounted on a separate table or on top of the instrument box as required. It contains a light tight cabinet where the Device Under Test (DUT) is mounted. It permits the measurement of individual device parameters to international standards, using referenced instruments. The device temperature is controlled by an external Heater / Chiller, under computer control. The software automatically switches in the instruments in turn. The spectral measurement is incorporated into the power measurement system. The addition of a near field or far field measurement , however requires the placement of a different measurement station in front of the DUT. A linear slide moves the parts automatically. The computer produces reports as selected by the operator automatically and can print certificate of conformance datasheets.